Atom Probe Field Ion Microscopy - Miller, M. K. (Metals and Ceramics Division, Metals and Ceramics Division, Oak Ridge National Laboratory, USA) a Cerezo, A. (Department of Materials, Department of Materials, University of Oxford) a Hetherington, M. G. a Smith FRS, G. D. W. (Professor Of Materi

A definitive account of the theory, practice, and applications of atom probe field ion microscopy (APFIM). The APFIM technique provides a unique method for observing and chemically identifying single atoms on solid surfaces. New applications for this technique are rapidly emerging and graduate level material and surface scientists will enjoy this account of the state-of-the-art.