CMOS Electronics - Segura, Jaume (Balearic Islands University, Palma de Mallorca, Spain ) a Hawkins, Charles F. (University of New Mexico, USA)

CMOS manufacturing environments are surrounded with symptoms that can indicate serious test, design, or reliability problems, which, in turn, can affect the financial as well as the engineering bottom line. This book will teach readers, including non-engineers involved in CMOS manufacture, to identify and remedy these causes.