Digital Noise Monitoring of Defect Origin - Aliev, Telman

Name: Digital Noise Monitoring of Defect Origin - Aliev, Telman
Brand: Springer-Verlag New York Inc.

Růst ceny o 1 %

Nejnižší cena od 10. 9. 2026: 2 644 Kč.

2 672 Kč

Springer-Verlag New York Inc.

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Digital Noise Monitoring of Defect Origin is for both academics and professionals in the fields of engineering, biological sciences, physical science, and automation with particular emphasis on power engineering, oil-and-gas extraction, and aviation among others.

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