Measurement and Modeling of Silicon Heterostructure Devices - Cressler, John D. (Georgia Institute of Technology, Atlanta, USA)

Focuses on measurement and modeling of high-speed conductor devices. This book provides experience-based tricks of the trade and the subtle nuances of measuring and modeling. It covers topics including compact modeling using integrated CAD tools and design kits, noise mitigation approaches, Germanium RF designs, and, transmission lines.