Semiconductor Material and Device Characterization - Schroder, Dieter K. (Arizona State University)

Name: Semiconductor Material and Device Characterization - Schroder, Dieter K. (Arizona State University)
Brand: John Wiley & Sons Inc

Stabilní cena

Aktuální cena je nejnižší za posledních 30 dní.

5 372 Kč

John Wiley & Sons Inc

Celý popis

Do obchodu

O produktu

This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers.

Tip: Podívejte se také na další produkty z kategorie Elektrotechnika.