Semiconductor Laser Engineering, Reliability and Diagnostics - Epperlein, Peter W. (Pwe-PhotonicsElectronics-IssueResolution a University of Stuttgart, Germany)

This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and device diagnostics in the same book, and thus closes the gap in the current book literature.