John Wiley & Sons Inc

Is it all About Image? - Iloniemi, Laura (Consultant - London, England)

Circuit Analysis For Dummies - Santiago, John

Fifth National Conference on Rapid Design, Prototyping and Manufacture

Event Marketing - Preston, C. A.

Serve to Be Great - Tenney, Matt

Steps to Safety Culture Excellence - Mathis, Terry L. a Galloway, Shawn M.

Mixed Models - Demidenko, Eugene (Dartmouth Medical School, Lebanon, NH, USA)

Kirk-Othmer Encyclopedia of Chemical Technology, Volume 11

Statistical Methods for Six Sigma - Joglekar, Anand M. (Joglekar Associates, MN, USA)

Manual Drafting for Interiors - Cavataio, Christine

Introduction to Behavioral Economics - Just, David R. (Cornell University)

Nanoscale Multifunctional Materials

Modern Experimental Stress Analysis - Doyle, James F. (Purdue University, Lafayette, USA)

Sustainable Resource Development - Zatzman, Gary M.

Data Analysis Using SQL and Excel - Linoff, Gordon S.

Biofilms in the Dairy Industry

Kirk-Othmer Encyclopedia of Chemical Technology, Volume 9

IMS - Poikselka, Miikka (Nokia, Finland) a Mayer, Georg (Nokia)

Customer's New Voice - McKean, John S.

Statistical Distributions - Forbes, Catherine (Monash University, Australia) a Evans, Merran (Monash University, Australia) a Hastings, Nicholas (Queensland University of Technology, Australia) a Peacock, Brian