Nanometer-scale Defect Detection Using Polarized Light - Dahoo, Pierre-Richard (University of Versailles Saint-Quentin, France) a Pougnet, Philippe (Vedecom Institute, Versailles, France) a El Hami, Abdelkhalak (Institut National des Sciences Appliquees (INSA-Rouen), France)4 125 Kč
Rethinking Engineering Education - Crawley, Edward F. a Malmqvist, Johan a Ostlund, Soren a Brodeur, Doris R. a Edstrom, Kristina3 265 Kč
Light-Matter Interaction - Weiner, John (Professor (retired), Professor (retired), Universite Paul Sabatier, Toulouse France) a Nunes, Frederico (Professor (retired), Professor (retired), Federal University of Pernambuco)1 781 Kč
Static And Dynamic Problems Of Nanobeams And Nanoplates - Chakraverty, Snehashish (National Inst Of Technology Rourkela, India) a Behera, Laxmi (National Inst Of Technology Rourkela, India)2 167 Kč
From Prognostics and Health Systems Management to Predictive Maintenance 2 - Chebel-Morello, Brigitte (University of Franche-Comte, France) a Nicod, Jean-Marc (ENSMM, France) a Varnier, Christophe (ENSMM, France)4 125 Kč
Uncertainty Analysis of Experimental Data with R - Shaw, Benjamin David (University of California, Davis, USA)3 906 Kč
Hydrostatic Testing, Corrosion, and Microbiologically Influenced Corrosion - Javaherdashti, Reza (Qatar University, Doha) a Akvan, Farzaneh (Parscorrosion Consultants, Perth, WA, Australia)1 844 Kč
